Silicon nitride
- Silicon nitride
- 12033-89-5
- Silicon nitride (Si3N4)
- Trisilicon tetranitride
- QHB8T06IDK
- Create:2005-08-09
- Modify:2025-01-11
- Si3N4
- silicon nitride
- Silicon nitride
- 12033-89-5
- Silicon nitride (Si3N4)
- Trisilicon tetranitride
- QHB8T06IDK
- Trisilicon tetranitride (alpha)
- UNII-QHB8T06IDK
- EINECS 234-796-8
- NEEDLELOK
- SINOVA
- BAYSINID ST
- EC 234-796-8
- MFCD00011230
- WIDIANIT N 2000
- SILICON (IV) NITRIDE
- DENKA SILICON NITRIDE SN-F 2
- Silicon Nitride Nanofiber
- 2,4,6,7-tetraza-1,3,5-trisilahexacyclo[3.1.1.01,4.02,5.03,6.03,7]heptane
- Silicon(IV) nitride
- Silicon(IV) nitride, alpha phase
- Silicium Nitricatum
- Si3N4
- Silicon IV nitride Powder
- SILICON NITRIDE [MI]
- Yttrium Oxide (Y2O3) Powder
- DTXSID20892247
- Silicon nitride, NIST RM 8983
- Silicon Nitride Powder, 98.5% Nano
- Iron Oxide (Fe3O4) Sputtering Targets
- AS-85364
- Silicon nitride fiber, >80% (crystalline)
- NS00131447
- Silicon nitride Si3N4 GRADE B 7 (H?gan?s)
- Silicon nitride Si3N4 GRADE M 11 (H?gan?s)
- Q413828
- Silicon nitride, powder, >=99.9% trace metals basis
- Silicon nitride, predominantly alpha-phase, <=10 micron
- StarCeram? N, Silicon Nitride, (rtp), Grade M (Kyocera)
- StarCeram? N, Silicon Nitride, (rtp), Grade P (Kyocera)
- 1Si-hexacyclo[3.1.1.0?,?.0?,?.0?,?.0?,?]trisilazane
- Silicon Nitride Si3N4 Grade HIGH PURITY for PV (H?gan?s)
- Silicon nitride, ERM(R) certified Reference Material, powder
- Particle size distribution standard for sedigraph calibration, NIST SRM 659
- Silicon nitride, predominantly beta-phase, <=10micron primary particle size
- Silicon nitride powder - specific surface area standard, NIST(R) SRM(R) 1900
- Silicon nitride, nanopowder, <50 nm particle size (BET), >=98% trace metals basis
- Silicon nitride, nanopowder, <50 nm particle size (spherical), >=98.5% trace metals basis
- Silicon nitride powders, NIST(R) SRM(R) 656, for quantitative analysis by powder diffraction
- Silicon(IV) nitride, MgO binder, sputtering target, 50.8mm (2.0in) dia x 3.18mm (0.125in) thick
- Auger electron spectroscopy
- electron density of states
- dielectric constant
- crystal structure
- sintering
- spheroidization
- enthalpy
- effective mass
- isothermal section
- Gibbs energy
- Wyckoff sequence
- phase equilibrium
- positional coordinate
- temperature-composition section
- space group
- molecular structure
- enthalpy change
- phase diagram
- unit cell parameter
- melting temperature
- binding energy
- charge transfer coefficient
- heat capacity
- reflectance
- transition enthalpy
- displacement parameter
- band gap energy
- atomic radius
- structural transition temperature
- plasma edge
- Coulomb interaction
- phase transition
- mass transfer coefficient
- Young's modulus
- Fourier transform infrared spectrum
- self-diffusion
- Pearson symbol
- band structure
- formation entropy
- elastic coefficients
- X-ray diffraction
- surface structure
- migration energy
- preexponential factor
- electron spin resonance
- surface acoustic wave
- surface diffusion
- atomic environment
- interaction coefficient
- phase stability
- transition entropy
- formation enthalpy
- reflection high-energy electron diffraction
- density
- crystallization temperature
- thermal grooving
- adsorbate coverage
- tensile strength
- formation energy
- phonon properties
- interaxial ratio
- transmission electron microscopy
- formula unit
- unit cell axes
- avoided-level-crossing muon spin resonance
- latent heat
- activation energy
- structure type
- refractive index
- scanning electron microscopy
- quasielastic neutron scattering
- entropy
- thickness of layer
- fracture toughness
- hardness
- phonon dispersion
- site multiplicity
- nuclear magnetic resonance
- diffusive flux
Metal Machining [Category: Heat or Machine]
Semiconductor Manufacturing [Category: Industry]
2019: <1,000,000 lb
2018: <1,000,000 lb
2017: <1,000,000 lb
2016: <1,000,000 lb
Not Classified
Reported as not meeting GHS hazard criteria by 250 of 257 companies (only 2.7% companies provided GHS information). For more detailed information, please visit ECHA C&L website.
Aggregated GHS information provided per 257 reports by companies from 5 notifications to the ECHA C&L Inventory.
Reported as not meeting GHS hazard criteria per 250 of 257 reports by companies. For more detailed information, please visit ECHA C&L website.
There are 3 notifications provided by 7 of 257 reports by companies with hazard statement code(s).
Information may vary between notifications depending on impurities, additives, and other factors. The percentage value in parenthesis indicates the notified classification ratio from companies that provide hazard codes. Only hazard codes with percentage values above 10% are shown.
Patents are available for this chemical structure:
https://patentscope.wipo.int/search/en/result.jsf?inchikey=HQVNEWCFYHHQES-UHFFFAOYSA-N
- Australian Industrial Chemicals Introduction Scheme (AICIS)Silicon nitride (Si3N4)https://services.industrialchemicals.gov.au/search-inventory/
- CAS Common ChemistryLICENSEThe data from CAS Common Chemistry is provided under a CC-BY-NC 4.0 license, unless otherwise stated.https://creativecommons.org/licenses/by-nc/4.0/Trisilicon tetranitridehttps://commonchemistry.cas.org/detail?cas_rn=12033-89-5
- ChemIDplusChemIDplus Chemical Information Classificationhttps://pubchem.ncbi.nlm.nih.gov/source/ChemIDplus
- EPA Chemical Data Reporting (CDR)LICENSEThe U.S. Government retains a nonexclusive, royalty-free license to publish or reproduce these documents, or allow others to do so, for U.S. Government purposes. These documents may be freely distributed and used for non-commercial, scientific and educational purposes.https://www.epa.gov/web-policies-and-procedures/epa-disclaimers#copyrightSilicon nitride (Si3N4)https://www.epa.gov/chemical-data-reporting
- EPA Chemicals under the TSCASilicon nitride (Si3N4)https://www.epa.gov/chemicals-under-tscaEPA TSCA Classificationhttps://www.epa.gov/tsca-inventory
- EPA DSSToxSilicon nitride (Si3N4)https://comptox.epa.gov/dashboard/DTXSID20892247CompTox Chemicals Dashboard Chemical Listshttps://comptox.epa.gov/dashboard/chemical-lists/
- European Chemicals Agency (ECHA)LICENSEUse of the information, documents and data from the ECHA website is subject to the terms and conditions of this Legal Notice, and subject to other binding limitations provided for under applicable law, the information, documents and data made available on the ECHA website may be reproduced, distributed and/or used, totally or in part, for non-commercial purposes provided that ECHA is acknowledged as the source: "Source: European Chemicals Agency, http://echa.europa.eu/". Such acknowledgement must be included in each copy of the material. ECHA permits and encourages organisations and individuals to create links to the ECHA website under the following cumulative conditions: Links can only be made to webpages that provide a link to the Legal Notice page.https://echa.europa.eu/web/guest/legal-noticeTrisilicon tetranitridehttps://chem.echa.europa.eu/100.031.620Trisilicon tetranitride (EC: 234-796-8)https://echa.europa.eu/information-on-chemicals/cl-inventory-database/-/discli/details/36523
- FDA Global Substance Registration System (GSRS)LICENSEUnless otherwise noted, the contents of the FDA website (www.fda.gov), both text and graphics, are not copyrighted. They are in the public domain and may be republished, reprinted and otherwise used freely by anyone without the need to obtain permission from FDA. Credit to the U.S. Food and Drug Administration as the source is appreciated but not required.https://www.fda.gov/about-fda/about-website/website-policies#linking
- New Zealand Environmental Protection Authority (EPA)LICENSEThis work is licensed under the Creative Commons Attribution-ShareAlike 4.0 International licence.https://www.epa.govt.nz/about-this-site/general-copyright-statement/
- DailyMed
- Haz-Map, Information on Hazardous Chemicals and Occupational DiseasesLICENSECopyright (c) 2022 Haz-Map(R). All rights reserved. Unless otherwise indicated, all materials from Haz-Map are copyrighted by Haz-Map(R). No part of these materials, either text or image may be used for any purpose other than for personal use. Therefore, reproduction, modification, storage in a retrieval system or retransmission, in any form or by any means, electronic, mechanical or otherwise, for reasons other than personal use, is strictly prohibited without prior written permission.https://haz-map.com/AboutSilicon nitridehttps://haz-map.com/Agents/18437
- National Drug Code (NDC) DirectoryLICENSEUnless otherwise noted, the contents of the FDA website (www.fda.gov), both text and graphics, are not copyrighted. They are in the public domain and may be republished, reprinted and otherwise used freely by anyone without the need to obtain permission from FDA. Credit to the U.S. Food and Drug Administration as the source is appreciated but not required.https://www.fda.gov/about-fda/about-website/website-policies#linking
- SpectraBaseSILICON NITRIDEhttps://spectrabase.com/spectrum/1BpMU14WhtjSILICON NITRIDEhttps://spectrabase.com/spectrum/1uoQJ4M5hxjSILICON NITRIDEhttps://spectrabase.com/spectrum/K5lxmWyHCmLSilicon nitridehttps://spectrabase.com/spectrum/24BRXGP0ekh
- Springer Nature
- SpringerMaterials
- Wikidatasilicon nitridehttps://www.wikidata.org/wiki/Q413828
- Wikipediasilicon nitridehttps://en.wikipedia.org/wiki/Silicon_nitride
- PubChem
- Medical Subject Headings (MeSH)LICENSEWorks produced by the U.S. government are not subject to copyright protection in the United States. Any such works found on National Library of Medicine (NLM) Web sites may be freely used or reproduced without permission in the U.S.https://www.nlm.nih.gov/copyright.htmlsilicon nitridehttps://www.ncbi.nlm.nih.gov/mesh/67032734Air Pollutants, Occupationalhttps://www.ncbi.nlm.nih.gov/mesh/68000395
- GHS Classification (UNECE)GHS Classification Treehttp://www.unece.org/trans/danger/publi/ghs/ghs_welcome_e.html
- NORMAN Suspect List ExchangeLICENSEData: CC-BY 4.0; Code (hosted by ECI, LCSB): Artistic-2.0https://creativecommons.org/licenses/by/4.0/NORMAN Suspect List Exchange Classificationhttps://www.norman-network.com/nds/SLE/
- EPA Substance Registry ServicesEPA SRS List Classificationhttps://sor.epa.gov/sor_internet/registry/substreg/LandingPage.do
- MolGenieMolGenie Organic Chemistry Ontologyhttps://github.com/MolGenie/ontology/
- PATENTSCOPE (WIPO)SID 403030112https://pubchem.ncbi.nlm.nih.gov/substance/403030112